Keysight Measurement Forum 2016

Keysight Measurement Forum(KMF) is Keysight Technologies' biggest annual signature event hosted across South East Asian countries. Representing every facet of ecosystem, we have more than 3000 attendees participated in this event over the past 3 years, ranging from universities, fabless semiconductor companies to IC design centre and other industries! Just how do you summarise this region’s biggest test and measurement seminar? We try to keep this brief:
  • Over 100 companies had participated in the past 3 years
  • More than 30 overseas Keysight division speakers were invited to share their measurement expertise and insights
  • More than 5 latest market technologies discussed in last year KMF – 5G, 802.11p, USB Type-C, DDR4, PAM4 and more!
  • More than 100 attendees participated in post-KMF webcast and more than 300 times presenter’s papers were downloaded.

This explain why this forum serves as a exciting platform for researchers and practitioners from both academia
and industry to meet and understand cutting-edge developments in the next tech mega-trend.

This year, we are catering 7 industry-specific booths for you to know and learn more about latest test and measurement solution:

  • Education and Manufacturing
  • Automotive and Energy
  • Cellular, Iot and Wireless Connection
  • Aerospace and Defence
  • Digital and Photonics Solution
  • Component Analysis
  • Semiconductor Measurement

And of course, our technical and solution partners’ solution will be showcase too.

Venue Date
Equatorial Hotel, Penang 10th May 2015
Marriott Tang Plaza Hotel, Singapore 13th May 2015

We promise you not only your day to be filled with valuable knowledge and technology updates,
but also excitement of winning following attractive lucky draw gifts!!

Time Agenda
08:45 - 09:15 Welcome coffee/tea & Registration
09:15 - 09:20 Opening Speech
09:20 - 10:00 Keynote Speech
10:00 - 10:30 Tea Break & Moving to Your Choice of Track
Track A: RF Component and Wireless Testing Track B: High Speed Digital & Power Testing
10:30 - 11:15
Paper 1
Evaluating Waveform Coexistence for 5G, Wireless and Radar Application
Paper 1
Testing USB 3.1 Type-C and Understanding the Type-C Test Environment
11:15 - 12:00
Paper 2
Be Low Power Wide Area Networks, NB-IoT and the Internet of Things
Paper 2
Identify and Remove Crosstalk From Your High-speed Signals
12:00 - 13:30 Lunch & Solution Booth Visit
13:30 - 13:45
Product Buzz 
How to Improve Emission Test System
Product Buzz 
Tips for Overcoming Probing Challenges
13:45 - 14:30
Paper 3
Faster, Better and Cheaper Ways to Test Today's Wireless Devices
Paper 3
Solving Signal and Power Integrity Design Challenges
14:30 - 14:45
Product Buzz 
Introducing New Generation of Signal Analyzer
Product Buzz 
N1090A DCA-M High Accuracy, Low Cost Solution for Optical Waveform Analysis
14:45 - 15:30 Tea Break & Solution Booth Visit
15:30 - 15:45
Product Buzz 
Introducing TVAC Power Sensor
Product Buzz 
Introducing New Device Current Waveform Analyzer
15:45 - 16:15
Paper 4 
Simplifying RF Design Integration
Paper 4 
Innovate An Energy Efficient Design Through Measurements for Automotive Electronics and Power Conversion Devices
16:15 - 16:45
Paper 5 
Improving Throughput Using New Generation of Network Analyzer
Paper 5 
Modern Measurement Tools to Solve IoT Design Validation and Characterization Challenges
16:45 - 17:00 Closing & Grand Lucky Draw

28 Apr 2016